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DEVICE FOR THE DETERMINATION OF THE DENSITY OF NON-OCCUPIED ELECTRONIC STATES OF A MATERIAL BELOW THE FERMI LEVEL

机译:确定费米级以下材料的非电子态的密度的装置

摘要

the invention relates to a device for determining the electronic states of a material.the device comprises a chamber (2) containing a material (4), means (8) for electron energies and such that, when the material.they are energy and less than eaccompanied by an emission of photons of different wavelengths; and a chamber (30) with a tube (26) into the vacuum chamber with an entry slit (38) and athe tube (28) with an exit slot (40) is adjustable; a network (32) located in the second chamber.set of features, and is able to rotate about an axis parallel to the lines for selecting wavelength photons; and detection means (12) of the photons).;application to the determination of the band gap of a semiconductor.
机译:本发明涉及一种用于确定材料的电子状态的装置。该装置包括容纳材料(4)的腔室(2),用于电子能量的装置(8),使得当该材料为能量且更少时而不是发射不同波长的光子;带有进入狭缝(38)的进入真空室的带有管子(26)的室(30)和带有出口狭缝(40)的管子(28)是可调的。网络(32),其位于第二腔室组中,并且能够绕平行于用于选择波长光子的线的轴线旋转;以及光子的检测装置(12)。;用于确定半导体的带隙。

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