首页> 外国专利> Brief description of the formation of films of polycrystalline silicon localized on the zones covered with silica of a silicon wafer and the application for the manufacture of a mos transistor is not plane self-aligned

Brief description of the formation of films of polycrystalline silicon localized on the zones covered with silica of a silicon wafer and the application for the manufacture of a mos transistor is not plane self-aligned

机译:简要介绍了形成在硅片的二氧化硅覆盖的区域上的多晶硅膜的形成以及用于制造mos晶体管的应用不是平面自对准的

摘要

A method for forming a self-aligned MOS power transistor. A layer of silicon nitride is deposited uniformly over a plate with limited oxide zones. The plate is then placed in an acid bath and subjected to a potential difference. Only the zones of the polycrystalline silicon layer which are over the silica zones remain.
机译:一种形成自对准MOS功率晶体管的方法。氮化硅层均匀地沉积在具有有限氧化物区的板上。然后将板置于酸浴中并进行电位差。仅保留二氧化硅层上方的多晶硅层区域。

著录项

  • 公开/公告号FR2466101B1

    专利类型

  • 公开/公告日1983-07-01

    原文格式PDF

  • 申请/专利权人 THOMSON CSF;

    申请/专利号FR19790023242

  • 发明设计人

    申请日1979-09-18

  • 分类号H01L21/306;H01L29/78;

  • 国家 FR

  • 入库时间 2022-08-22 10:01:30

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