DEVICE FOR APPLYING TWO-STATE LOGIC LOGIC SIGNALS ON AN INPUT OF A LOGIC CIRCUIT AND APPLICATION TO AUTOMATIC TESTING OF A PLURALITY OF LOGIC CIRCUITS

摘要

THE INVENTION RELATES TO A DEVICE FOR APPLYING TWO-STATE TEST SIGNALS ON AN INPUT OF A LOGIC CIRCUIT AND AN APPLICATION OF THIS DEVICE TO AUTOMATIC TESTS OF A PLURALITY OF LOGIC CIRCUIT. /P P THE LOGIC CIRCUIT 3 PROVIDES ON AN OUTPUT 4, SIGNALS WITH TWO LOGIC STATES DEPENDING RESPECTIVELY ON TWO LOGIC STATES 0 OR 1 OF CONTROL SIGNALS APPLIED TO AN INPUT 2 OF THIS CIRCUIT, THROUGH OUTPUT 6 OF A CONTROL MEANS 5. THE DEVICE IS CHARACTERIZED IN THAT IT IS CONSTITUTED BY MEANS 1 TO IMPOSE EACH LOGIC STATE OF THE TEST SIGNALS ON INPUT 2 OF THE LOGIC CIRCUIT, WHATEVER THE LOGIC STATE OF THE CONTROL SIGNALS. /P P APPLICATION TO LOGIC CIRCUIT TESTS