THE PREPARATION OF SAMPLES FOR THE ANALYSIS OF THE TECHNOLOGICAL SURFACE OF METAL MATERIALS BY MEANS OF THE ELECTRON MICROANALYZER

• 1. 一种扫描电子显微镜进行粉末状样品形貌观察的分析方法 [P] . 中国专利： CN102419382A . 2012-04-18
• 2. 一种比表面积孔径分析仪的样品制备装置 [P] . 中国专利： CN213121322U . 2021-05-04
• 3. SURFACE ANALYSIS METHOD OF MATERIAL IN ARBITRARY SHAPE BY ELECTRONIC PROBE MICROANALYZER [P] . 日本专利： JP2000214108A . 2000-08-04

  机译： 电子探针显微分析仪对任意形状的材料进行表面分析

• 4. RAMAN SPECTROSCOPE FOR DETECTING RESIDUAL CHEMICAL MATERIALS ON THE SURFACE OF SAMPLE AND A RAMAN SPECTROSCOPIC ANALYSIS METHOD USING THE SAME CAPABLE OF DETECTING A VERY SMALL AMOUNT OF CHEMICAL MATERIALS REMAINING ON THE SURFACE OF SAMPLE BY INJECTING LIGHT TO SAMPLE AND MAKING A QUANTITATIVE ANALYSIS FOR DISPERSED RAMAN LIGHT [P] . 韩国专利： KR20110068452A . 2011-06-22

  机译： 用于在样品表面上检测残留化学物质的拉曼光谱法和拉曼光谱分析方法，其方法是通过对样品和样品进行定量分析，同时检测样品表面上残留的非常少量的化学材料。光

• 5. INCLUSION ANALYSIS METHOD OF SAMPLE BY ELECTRON PROBE MICROANALYZER [P] . 日本专利： JP2000214112A . 2000-08-04

  机译： 电子探针微分析仪的样品夹杂物分析方法

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