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Apparatus for automatic measurement of equivalent circuit parameters of piezoelectric resonators

机译:自动测量压电谐振器等效电路参数的装置

摘要

A heterodyne zero-phase detector (A) produces a phase output signal whose phase varies with the phase difference between a selectively variable test signal and the same selectively variable test signal as modified by being applied to a piezoelectric resonator (B). The heterodyne zero-phase detector includes a voltage controlled oscillator (16) for generating the selectively variable test signal, a first balanced mixer (32) for mixing the selectively variable test signal with a selectively variable heterodyne reference signal, a second balanced mixer (34) for mixing the selectively variable test signal as modified by the piezoelectric resonator with the variaable heterodyne reference signal, and a phase detector (50) for receiving the output of the balanced mixers to produce the phase output signal. A characteristic frequency locking feedback loop (C) feeds back the phase output signal to control the voltage controlled oscillator to vary the selectively variable test signal in such a manner that the phase output signal approaches zero. A fixed test frequency locking feedback loop (D) locks the fixed frequency test signal from the first and second balanced mixers to the preselected fixed frequency. The fixed test signal frequency locking feedback loop includes a variable heterodyne signal generator (70) and a heterodyne signal generator control (72) for controlling the heterodyne reference signal generator. The heterodyne reference signal generator is connected with one of the balanced mixers to receive one of the fixed frequency test signals therefrom and to adjust the heterodyne reference signal generator such that the frequency of the fixed frequency test signal is held at the preselected fixed frequency. In this manner, the heterodyne reference signal is held to the variable test signal offset by a multiple of the preselected fixed frequency.
机译:外差零相检测器(A)产生相位输出信号,其相位随着选择性可变测试信号和通过施加到压电谐振器(B)而修改的相同选择性可变测试信号之间的相位差而变化。外差零相检测器包括用于产生选择性可变测试信号的压控振荡器(16),用于将选择性可变测试信号与选择性可变外差参考信号混合的第一平衡混频器(32),第二平衡混频器(34) )用于将由压电谐振器修改的选择性可变测试信号与可变外差参考信号进行混频;以及相位检测器(50),用于接收平衡混频器的输出以产生相位输出信号。特征频率锁定反馈环路(C)反馈相位输出信号,以控制压控振荡器以使相位输出信号接近零的方式改变选择性可变测试信号。固定测试频率锁定反馈环路(D)将来自第一和第二平衡混频器的固定频率测试信号锁定到预选的固定频率。固定测试信号锁频反馈回路包括可变外差信号发生器(70)和用于控制外差参考信号发生器的外差信号发生器控制器(72)。外差基准信号发生器与平衡混频器之一连接,以从其中接收固定频率测试信号之一,并调整外差基准信号发生器,以使固定频率测试信号的频率保持在预选的固定频率。以这种方式,将外差参考信号保持为可变测试信号偏移了预选固定频率的倍数。

著录项

  • 公开/公告号US4447782A

    专利类型

  • 公开/公告日1984-05-08

    原文格式PDF

  • 申请/专利权人 TRANSAT CORP.;

    申请/专利号US19820359060

  • 发明设计人 JOHN P. RUTKOSKI;

    申请日1982-03-17

  • 分类号G01R29/22;H03L7/00;

  • 国家 US

  • 入库时间 2022-08-22 08:38:48

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