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X-RAY TOPOGRAPH METHOD

机译:X射线断层扫描法

摘要

PURPOSE:To enable the sharp image pick-up of an individual transition line, by interposing a spectral crystal between a specimen and an image pick-up film and diffracting diffraction X-ray from the specimen by the spectral crystal to allow the same to be incident on the image pick-up film. CONSTITUTION:Incident X-rays 1 issued from an X-ray source is incident on a single crystal 3 through a slit 2 so as to form a special angular expanse for several min and diffracted at a Bragg angle thetaB to generate emitted X-rays 4. The single crystal 3 is scanned in parallel to a direction shown by the arrow. Diffracted rays 4 of X-rays incident on a perfect crystal part A generate a sharp peak and diffracted rays 4' having a wide width are generated in the vicinity containing a transition line B. Diffracted X-rays 4 are incident on a spectral crystal 5 at an incident angle of thetaM and emitted at the same diffraction angle to be incident on an image pick-up film 7 as diffracted rays 6, 6'. Because the spectral crystal 5 is interposed, the width of the diffracted rays of the transition line becomes narrow and the sharp image pick-up of the transition line is enabled.
机译:目的:通过将光谱晶体置于标本和图像拾取膜之间,并通过光谱晶体对标本的衍射X射线进行衍射,以使单个过渡线能够进行清晰的图像拾取,从而使其能够被分离入射到摄像胶片上。组成:从X射线源发出的入射X射线1通过狭缝2入射在单晶3上,从而形成特殊的角度扩展达几分钟,并以布拉格角θB衍射,产生出射的X射线4。单晶3平行于箭头所示的方向被扫描。入射到完美晶体部分A上的X射线的衍射射线4产生尖锐的峰,并且在包含过渡线B的附近产生具有宽宽度的衍射射线4'。衍射X射线4入射在光谱晶体5上以θM的入射角入射,并以与衍射光6、6'相同的衍射角入射到图像摄取膜7上。因为插入了光谱晶体5,所以过渡线的衍射光的宽度变窄,并且能够进行清晰的过渡线摄像。

著录项

  • 公开/公告号JPS6038643A

    专利类型

  • 公开/公告日1985-02-28

    原文格式PDF

  • 申请/专利权人 NIPPON DENKI KK;

    申请/专利号JP19830146924

  • 发明设计人 MATSUI JIYUNJI;

    申请日1983-08-11

  • 分类号G01N23/205;

  • 国家 JP

  • 入库时间 2022-08-22 08:25:08

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