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METHOD OF LASER ANNEALING OF SUBSURFACE ION IMPLANTED REGIONS

机译:表面离子注入区的激光退火方法

摘要

ABSTRACTA METHOD OF LASER ANNEALING OFSUBSURFACE ION IMPLANTED REGIONSA method for annealing ion implantedregions buried in a semiconductor substratewithout the undesirable effects of thermaldiffusion which includes the radiation of thesubstrate by a continuous laser having anemission frequency longer than 600 nanometerswhich the buried ion implanted regions willabsorb strongly but which will be substantiallyunabsorbed by the unimplanted regions.Superior results can be obtained when thesubstrate is heated to approximately 300° dur-ing this laser annealing.
机译:抽象激光退火的一种方法地下离子注入区离子注入退火的方法掩埋在半导体衬底中的区域没有热的不良影响包括辐射在内的扩散通过具有发射频率超过600纳米掩埋离子注入区将吸收很强,但实际上会未被未植入区域吸收。当将基板加热至约300°进行激光退火。

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