METHOD OF MEASURING INSULATION RESISTANCE AND CAPACITANCE OF ELECTRIC CIRCUITS

• 1. 用于避免电容绝缘电阻故障的电容串联电路 [P] . 中国专利： CN202513567U . 2012.10.31
• 2. 一种高场强下金属化膜电容器绝缘电阻测量方法及装置 [P] . 中国专利： CN102435852B . 2015.01.28
• 3. INSULATION RESISTANCE MEASURING DEVICE OF DC CIRCUIT, CAPACITANCE MEASURING DEVICE, INSULATION RESISTANCE MEASURING METHOD, AND CAPACITANCE MEASURING METHOD [P] . 日本专利： JP2012233825A . 2012-11-29

  机译： 直流电路的绝缘电阻测量装置，电容测量装置，绝缘电阻测量方法和电容测量方法

• 4. INSULATION RESISTANCE MEASURING INSTRUMENT OF DC CIRCUIT, ELECTROSTATIC CAPACITANCE MEASURING INSTRUMENT, INSULATION RESISTANCE MEASURING METHOD AND ELECTROSTATIC CAPACITANCE MEASURING METHOD [P] . 日本专利： JP2006343267A . 2006-12-21

  机译： 直流电路的绝缘电阻测量仪器，静电电容测量仪器，绝缘电阻测量方法及静电电容测量方法

• 5. METHOD OF MEASURING INSULATION RESISTANCE AND CAPACITANCE OF ELECTRIC NETWORKS [P] . SU1707569A1 . 1992-01-23

  机译： 电网绝缘电阻和电容的测量方法

• 1. THE INVESTIGATION OF THE METAL DAMAGE AT THE CREEP BY THE METHOD OF ELECTRICAL RESISTANCE MEASURING [J] . 力学学报：英文版 . 1991,第002期
• 2. Test and analysis of the influence of the transformer insulation resistance and dielectric loss [J] . ZHANG Mengjie, HU Shunbin, SUN JiaLong, 国际英语教育研究：英文版 . 2015,第010期
• 3. Measuring Method of Equivalent Series Capacitance and Negative Resistance of Quartz Crystal Oscillator Circuits [C] . Toki M., Tsuzuki Y., Mitsuoka T. 37th Annual Symposium on Frequency Control. 1983 . -1
• 4. THE SINGLE-ENDED SEMICONDUCTOR DIODE MIXER: A MATHEMATICAL MODEL WHICH INCLUDES THE EFFECTS OF CIRCUIT RESISTANCE, DIODE CAPACITANCE, DC BIAS, AND CIRCUIT FILTERS [D] . BOWEN, CLARENCE EDWARD -1
• 5. Defibrillation failure with an electrical short circuit caused by internal insulation breach [O] . Takuo Tsurugi, Junjiroh Koyama, Kazuhisa Kodama, 2021
• 6. Special Articles: The Problem of Evaluation of Insulation Reliability for Printed Circuit Boards. Measurement Techniques of Dielectric Characteristics Suitable for Electrical Insulating Materials Used for Printed Circuit Boards and Their Application to the Estimation of Reliability on Insulation Properties. [O] . Eiki WATANABE 1995

• 1. New Analysis to Measure the Capacitance and Conductance of MOS Structure toward Small Size of VLSI Circuits [J] . Wagah Farman Mohammad . 电路与系统（英文） . 2011,第3期
• 2. NUMERICAL SIMULATION FOR MEASURING ATMOSPHERE CARBON POTENTIAL BY ELECTRIC RESISTANCE METHOD [J] . W.M. Zhang ,M.J. Hu ,Y.J. Li . 金属学报：英文版 . 2000,第2期
• 3. New Method of Measuring the Positive-sequence Capacitance of T-connection Transmission Lines [J] . Yuansen Zhang ,Demin Cui ,Qingtao Cao . 能源与动力工程（英文） . 2013,第4期
• 4. 话缆绝缘电阻测量方法的探索 [C] . 刘玉兰 . 2006年电线电缆行业高技能人才论坛 . 2006
• 5. 电容器绝缘电阻自动化测试系统设计与开发 [A] . 贺伟 . 2012