System and process for determining the basis weight of a low atomic number material in a mixture with a higher atomic number material

摘要

The invention relates to an apparatus and a process for determining the relative quantity of a low atomic number material in a mixture of the material and a high atomic number material.;The apparatus comprises a first source (16) for directing a first beam of X rays into the mixture, a second source (20) for directing a second beam of X rays into the mixture, a first and a second detectors (34, 36) for detecting respectively the first and second beams in the absence of the mixture and for detecting respectively the portion of the first and second beams transmitted through the mixture. The apparatus also comprises a computer (60) coupled to the first and second detectors to determine, upon the detected beams, the relative quantity of the low atomic number material.;Application to the measurement of the concentration of binder material in fiber glass.