Process and device for inspecting a surface in simulated manner which differs from the real surface scanning by an eddy current transducer

摘要

The invention relates to a process and to devices for the inspection of the surface of a member by means of an eddy current probe. By scanning the member means of the transducer following a given path, the sampled values of the signal supplied by the transducer are recorded for clearly defined positions of the transducer. By restoring the signals, it is possible to simulate a displacement of the transducer along a different path and/or simulate the displacement of a larger size or different type of transducer. The process may be used in steam generators in nuclear reactors and to the examination of irradiated fuel rods in these reactors.