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Method of testing analog/digital converter and structure of analog/digital converter suited for the test
Method of testing analog/digital converter and structure of analog/digital converter suited for the test
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机译:测试模拟/数字转换器的方法和适合该测试的模拟/数字转换器的结构
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摘要
A method of testing a successive comparison type analog/digital converter which incorporates a voltage comparator, a register for successive comparison and a digital/analog converter. A reference digital signal is inputted to the incorporated digital/analog comparator to be converted into an analog signal, while a digital signal corresponding to the reference digital signal is inputted to an externally provided reference digital/analog converter to be converted into an analog signal. Both analog signals thus produced are compared with each other through the incorporated voltage comparator to thereby determine conversion accuracy. A successive comparison type analog/digital converter suited for the test includes further a change- over switch for introducing the externally supplied digital signal to the incorporated digital/analog converter and a changeover switch for leading outwardly the output signal from the voltage comparator.
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