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STANDARD SAMPLE FOR MEASURING THICKNESS OF OXIDE LAYER OF ZIRCONIUM-BASE ALLOY MEMBER

机译:锆基合金氧化层厚度测量的标准样品

摘要

PURPOSE:To obtain a standard sample for measuring the thickness of the oxide layer of a zirconium-base alloy member having good calibration accuracy and long life by providing an insulating oxide layer to a prescribed film thickness on the surface of the zirconium-base alloy. CONSTITUTION:Zr alloys such as zircalloy-2, -4, Zr-2.5%Nb and Zr-1%Nb known generally as the alloy for atomic reactors are usable for the zirconium-base alloy member. Any insulator is usable for the insulating oxide layer and is exemplified by ceramic layers of zirconium oxide, aluminum oxide, etc. A sample to be measured is a Zr alloy and plural pieces are preferably provided by using the zirconium oxide and changing the film thicknesses in order to measure the thickness of the oxide layer thereof. Since the specified thickness of the oxide layer is reproduced with the long life and high accuracy in the above-mentioned manner, the calibration with the extremely high accuracy is made possible.
机译:用途:通过在锆基合金表面上提供规定厚度的绝缘氧化物层,获得具有良好校准精度和长寿命的用于测量锆基合金构件的氧化层厚度的标准样品。组成:Zrcalloy-2,-4,Zr-2.5%Nb和Zr-1%Nb之类的Zr合金通常用作原子反应堆合金,可用于锆基合金构件。任何绝缘体都可以用作绝缘氧化物层,并且以氧化锆,氧化铝等的陶瓷层为例。待测样品是Zr合金,并且优选通过使用氧化锆并改变膜厚来提供多片。为了测量其氧化物层的厚度。由于以上述方式以长寿命和高精度再现了规定的氧化层厚度,因此可以进行极高精度的校准。

著录项

  • 公开/公告号JPS6271801A

    专利类型

  • 公开/公告日1987-04-02

    原文格式PDF

  • 申请/专利权人 TOSHIBA CORP;

    申请/专利号JP19850211058

  • 申请日1985-09-26

  • 分类号C23C30/00;C23C4/00;G01B7/00;G01B7/06;

  • 国家 JP

  • 入库时间 2022-08-22 07:22:39

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