DEVICE FOR PARALLEL SCANNING OF TRANSILLUMINATED AND RASTERIZED IMAGE IN ELECTRON MISCROSCOPE

• 1. 扫描透射电子显微镜中提高原子序数衬度像质量的方法 [P] . 中国专利： CN103149228B . 2015.06.03
• 2. 扫描透射电子显微镜中提高原子序数衬度像质量的方法 [P] . 中国专利： CN103149228A . 2013-06-12
• 3. PROBE UNIT AND ITS MANUFACTURE, INFORMATION PROCESSING DEVICE, AND SCANNING TUNNELING ELECTRON MISCROSCOPE [P] . 日本专利： JPH0552509A . 1993-03-02

  机译： 探针单元及其制造商，信息处理设备和隧道电子扫描显微镜

• 4. Method, device and laser scanning microscope for generating rasterized images [P] . 美国专利： US10795140B2 . 2020-10-06

  机译： 产生光栅图像的方法，装置和激光扫描显微镜

• 5. Method, Device and Laser Scanning Microscope for Generating Rasterized Images [P] . 美国专利： US2017248778A1 . 2017-08-31

  机译： 光栅图像生成方法，装置及激光扫描显微镜

• 1. An improved method to distinguish between scanned and rasterized document images [J] . SUN Juelu 宝钢技术研究（英文版） . 2014,第001期
• 2. OBSERVATION AND ANALYSIS OF BLOOD CONTACTING SURFACE OF LEFT VENTRICULAR ASSIST DEVICE WITH SCANNING ELECTRON MICROSCOPY [J] . 王惠荪, 金永安, 秦家楠 上海交通大学学报：医学英文版 . 1989,第0Z1期
• 3. Optical Imaging meets MS Imaging: Integrating a Dual-Beam Scanning Electron Microscope and a SIMS into one Device for Simultaneous Imaging [C] . Alexander Laue, Albrecht Glasmachers, Albrecht Brockhaus, American Society for Mass Spectrometry Conference on Mass Spectrometry and Allied Topics . 2012
• 4. Low Temperature Scanning Probe Microscope for Imaging Nanometer Scale Electronic Devices. [D] . Trodahl, Halvar Joseph. 2011
• 5. Laser Scanning Confocal Thermoreflectance Microscope for the Backside Thermal Imaging of Microelectronic Devices [O] . Dong Uk Kim, Chan Bae Jeong, Jung Dae Kim, 2017
• 6. Reproducible strain measurement in electronic devices by applying integer multiple to scanning grating in scanning moiré fringe imaging [O] . Suhyun Kim, Younheum Jung, Joong Jung Kim, 2014
• 7. Scan Line Access Memories for High Speed Image Rasterization [R] . Demetrescu, S. G. 1986

• 1. A MONTE CARLO SIMULATION OF SECONDARY ELECTRON AND BACKSCATTERED ELECTRON IMAGES IN SCANNING ELECTRON MICROSCOPY [J] . H.M.Li Z.J.Ding . 金属学报：英文版 . 2005,第3期
• 2. Optimized cardiac magnetic resonance imaging inversion recovery sequence for metal artifact reduction and accurate myocardial scar assessment in patients with cardiac implantable electronic devices [J] . El-Sayed H Ibrahim ,Mason Runge ,Jadranka Stojanovska . 世界放射学杂志：英文版（电子版） . 2018,第9期
• 3. Applications of Secondary Electron Composition Contrast Imaging Method in Microstructure Studies on Heterojunction Semiconductor Devices and Multilayer Materials [J] . 刘安生 ,邵贝羚 ,安生 . 稀有金属：英文版 . 1999,第2期
• 4. 透射电子显微镜中可控纳米精度电子束刻蚀与原位电学输运性质测量 [C] . 张超 ,徐强 ,吴梦月 . 2013年全国电子显微学学术会议 . 2013
• 5. 扫描电子显微镜中二次电子成像机制和分辨率的Monte Carlo模拟 [A] . 阮瞩 . 2015