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COMBINATORY LOGIC CIRCUIT TESTING DEVICE AND INTEGRATED CIRCUIT COMPRISING SUCH A DEVICE.

机译:组合逻辑电路测试设备和包含此类设备的集成电路。

摘要

P This device for testing a combinational logic circuit 4, comprises on the one hand a test sequence generator circuit 30 for applying to N inputs of the combinational logic circuit test logic signals and on the other hand a output 5 to analyze the output signals of the combinational logic circuit, these test sequences consisting in successively applying to each of the N inputs E1, E2, E3 and E4 an alternating sequence, at least twice, of "1" and "O "logic while to the other inputs is applied a word of N-1 binary elements to ensure the transmission of said alternating sequence to the output of the combinational logic circuit. BR/ Application: testing of logic circuits. BR/ (CF DRAWING IN BOPI) BR/ BR/ /P
机译:

该用于测试组合逻辑电路4的设备,一方面包括测试序列生成器电路30,用于将组合逻辑电路的N个输入施加到测试逻辑信号,另一方面,输出5用于分析输出信号在组合逻辑电路的测试中,这些测试序列包括依次对N个输入E1,E2,E3和E4中的每一个依次施加交替的序列(至少两次)“ 1”和“ O”逻辑,同时对其他输入施加N-1个二进制元素的一个字,以确保将所述交替序列传输到组合逻辑电路的输出。
应用:逻辑电路测试。
(在BOPI中绘制CF)

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