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Low internal temperature technique for hermetic sealing of microelectronic enclosures

机译:用于微电子外壳气密密封的内部低温技术

摘要

A technique for enclosing microelectronic circuit elements in hermetically sealed packages comprising a planar ceramic substrate with a box-like ceramic cover sealed thereto by a fused glass coating. The glass sealant is applied to the substrate in the form of a paste which thereafter is fired at high temperature and cooled to produce a smooth glass coating. With the cover in place on the substrate, the glass coating is remelted by heat developed by infra-red radiation developed by four line-focussed radiant heaters at the four sides of the package. The radiation of each heater is focussed at the interface line between the cover and the substrate. Because the radiant heat is concentrated along the interface line, unwanted heat transfer into the package is minimized, and the temperature is prevented from rising sufficiently to damage heat- sensitive elements. Upon removal of the radiant heat, the glass hardens in a condition of fusion and/or chemical bonding with the cover and substrate providing true hermetic sealing.
机译:一种将微电子电路元件封闭在密封包装中的技术,该密封包装包括平面陶瓷基板,该基板具有通过熔融玻璃涂层密封在其上的盒状陶瓷盖。将玻璃密封剂以糊剂的形式施加到基材上,然后将其在高温下焙烧并冷却以产生光滑的玻璃涂层。将盖子放在基板上的适当位置后,玻璃涂层会被封装四个侧面的四个线聚焦辐射加热器产生的红外线辐射所产生的热量重熔。每个加热器的辐射都聚焦在盖子和基板之间的界面线上。由于辐射热沿着界面线集中,因此将不必要的热量传递到封装中的可能性降至最低,并且防止了温度升高到足以损坏热敏元件的程度。在去除辐射热后,玻璃在与盖和基板熔融和/或化学结合的条件下硬化,从而提供真正的气密密封。

著录项

  • 公开/公告号US4685200A

    专利类型

  • 公开/公告日1987-08-11

    原文格式PDF

  • 申请/专利权人 ANALOG DEVICES INCORPORATED;

    申请/专利号US19820340279

  • 发明设计人 DELIP R. BOKIL;

    申请日1982-01-18

  • 分类号H01L21/58;

  • 国家 US

  • 入库时间 2022-08-22 07:08:56

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