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ENERGY SCANNING TYPE X-RAY TOMOGRAPHIC IMAGING APPARATUS

机译:能量扫描型X射线断层成像仪

摘要

PURPOSE:To measure an interatomic distance and an atomic distribution state with high accuracy, by continuously scanning a substance by X-ray energy from the vicinity of the absorption end of the arbitrary element in the substance to a high energy side. CONSTITUTION:X-rays from an X-ray source 1 are allowed to be incident to a specimen 4 through a detector 2 and the intensity of X-rays is detected by a detector 3. Said detector 3 is arranged in large numbers at a minute interval and the incident angle theta of X-rays is continuously changed between 0-90 deg.. The absorptivity of X-rays is measured in such a state that energy lower than the proper absorption end of an aiming element is set to a start point. Further, the energy of X-rays is allowed to continuously scan from the absorption end to a high energy side. At this time, an X-rays absorption spectrum mu is calculated from the X-ray intensity ratio of the detectors 2, 3 before and after X-rays are incident and EXAFS (Extended X-ray Absorption Fine Structure) is calculated from said spectrum. Since EXAFS is calculated, the distribution state of the element, the interatomic distance thereof and number of coordinations in a substance can be measured quantitatively.
机译:目的:通过用X射线能量从物质中任意元素的吸收端附近到物质的高能侧连续扫描物质,以高精度测量原子间距离和原子分布状态。组成:来自X射线源1的X射线被允许通过检测器2入射到标本4,并且X射线的强度被检测器3检测。所述检测器3在一分钟内大量排列X射线的间隔和X射线的入射角theta在0-90度之间连续变化。在这样的状态下测量X射线的吸收率:将低于瞄准元件正常吸收端的能量设置为起点。此外,允许X射线的能量从吸收端到高能量侧连续扫描。此时,从入射X射线前后的检测器2、3的X射线强度比算出X射线吸收谱μ,并根据该谱算出EXAFS(扩展X射线吸收精细结构)。 。由于计算出EXAFS,因此可以定量地测定元素的分布状态,其原子间距离和配位量。

著录项

  • 公开/公告号JPS6361154A

    专利类型

  • 公开/公告日1988-03-17

    原文格式PDF

  • 申请/专利权人 HITACHI LTD;

    申请/专利号JP19860203674

  • 发明设计人 KAJIYAMA HIROSHI;SUZUKI YOSHIO;

    申请日1986-09-01

  • 分类号G01N23/04;

  • 国家 JP

  • 入库时间 2022-08-22 07:04:12

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