QUANTITATIVE ANALYSIS BY MEANS OF THE MEAN ATOMIC NUMBER OF¹PHASES CONTAINING A LIGHT ELEMENT USING A SCANNING¹MICROSCOPE AND AN IMAGE ANALYSER

• 1. 一种含轻元素低品位矿物的定量分析方法 [P] . 中国专利： CN113075243A . 2021-07-06
• 2. 用于确定材料的平均原子序数和质量的方法和系统 [P] . 中国专利： CN102890095B . 2015.11.18
• 3. Method of quantitative analysis by means of the mean atomic number of phases containing a light element using a scanning microscope and an image analyser [P] . 美国专利： US4847495A . 1989-07-11

  机译： 利用扫描显微镜和图像分析仪，通过含轻元素的平均原子序数进行定量分析的方法

• 4. METHOD OF QUANTITATIVE ANALYSIS BY MEANS OF THE MEAN ATOMIC NUMBER OF PHASES CONTAINING A LIGHT ELEMENT USING A SCANNING MICROSCOPE AND AN IMAGE ANALYSER [P] . IL85995D0 . 1988-09-30

  机译： 利用扫描显微镜和图像分析仪对含轻元素的平均原子数进行定量分析的方法

• 5. Method of dosing with the aid of the average atomic number of phases containing a light element using a scanning microscope and an image analyser [P] . 欧洲知识产权局专利： EP0291420A1 . 1988-11-17

  机译： 使用扫描显微镜和图像分析仪借助包含轻元素的平均原子序数进行配量的方法

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• 2. Quantitative imaging of sheet resistance, permittivity, and ferroelectric critical phenomena with a near-field scanning microwave microscope. [D] . Steinhauer, David Ethan. 2000
• 3. Confocal scanning light microscopy of the Escherichia coli nucleoid: comparison with phase-contrast and electron microscope images. [O] . J A Valkenburg, C L Woldringh, G J Brakenhoff, 1985
• 4. Analysis of micronic phases containing light elements by quantitative backscattered electron microscopy and Image Analysis [O] . Alain Dubus 1991

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