DEVICE FOR TESTING A HIGHLY INTEGRATED MICROPROGRAM CONTROLLED ELECTRONIC COMPONENT.

摘要

An apparatus for testing a highly-integrated microprogram-controlled electronic component in combination with the component, includes a sequencer disposed in the component for forming microprogram sequence links, and a test register disposed in the component having outputs connected to the sequencer for controlling a test, the test register having an input being connectible to a central processing unit and to an external testing device.