Method and device for determining the crystallographic texture of a polycrystalline material

摘要

A curved counter (30) is placed in a plane perpendicular to the incident X-ray beam (211). The plane of the specimen (1) is oriented so that it makes a predetermined angle beta with the incident beam (211). The counter (30) is moved parallel to the incident beam (211) until the counter (30) coincides with a section of the Debye cone (201) defined by the diffracted beams (214). The specimen (1) is rotated about the (Oz) axis perpendicular to it. The density of the diffracted radiation is measured on the counter (30) for each position as a function of the angular position in azimuth of the specimen (1). The position and the density of the normals to a family of lattice planes (hkl) of the specimen is established in the form of a pole figure from the measurements made with the counter (30).