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Optical measuring device of close to the surface and its application to the notes of the profile of a surface

机译:靠近表面的光学测量装置及其在表面轮廓注释中的应用

摘要

The invention relates to an optical measuring device of close to the surface and its application to the notes a profile. / p & & p & the device comprises a sender of the radiation 14 forming a light spot of the surface s and two detectors 30, 32 which are sensitive to the light flux sent back by the latter. The focusing means 26, 28 having focal lengths are associated with various detectors. The ratio between the signals q issued by the detectors is determine by a circuit 40. This ratio is representative of the distance d, independently of the angle of incidence of the incident beam and of the coefficient of reflection of the surface.
机译:本发明涉及一种靠近表面的光学测量装置及其在笔记型材上的应用。 & &该装置包括形成表面s的光斑的辐射14的发送器和两个检测器30、32,其对由后者返回的光束敏感。具有焦距的聚焦装置26、28与各种检测器相关联。由检测器发出的信号q之间的比率由电路40确定。该比率表示距离d,与入射光束的入射角和表面的反射系数无关。

著录项

  • 公开/公告号FR2560377B1

    专利类型

  • 公开/公告日1988-05-13

    原文格式PDF

  • 申请/专利权人 COMMISSARIAT A ENERGIE ATOMIQUE;

    申请/专利号FR19840003168

  • 发明设计人 BERNARD LERAT;

    申请日1984-02-29

  • 分类号G01B11/14;B23K9/28;B25J19/04;G01B11/24;

  • 国家 FR

  • 入库时间 2022-08-22 06:51:20

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