Method and device of determination of the crystallographic texture of a polycrystalline material

摘要

According to the invention, there is a counter curve 30 in a plane perpendicular to the beam of incident x-rays 211, it directs the plane of the sample 1 of a manner that it define predetermineb an angle with respect to the incident beam 211, it is moves the counter 30 parallel to the incident beam 211 to the fact that the counter 30 coincides with a section of the cone debye 201 defined by the beams diffracted 214, the sample 1 is made to rotate about the axis oz perpendicular to that - latter, is measured for each position on the counter 30 as a function of the angular position of the azimuth angle of the sample 1, the density of radiation and diffracts establishes the position and the density of the normal to a family of planes reticular hkl of the sample in the form of a figure of poles, on the basis of measurements carried with the counter 30. / p & & p & application is the determination of the crystallographic texture of materials).