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APPARATUS AND METHOD FOR LOCAL CHEMICAL ANALYSIS ON THE SURFACE OF SOLID MATERIALS BY X-RAY PHOTO-ELECTRON SPECTROSCOPY

机译:X射线光电子能谱法对固体材料表面进行局部化学分析的装置和方法

摘要

P THE APPARATUS FOR LOCAL CHEMICAL ANALYSIS ON THE SURFACE OF SOLID MATERIALS BY X-PHOTO ELECTRON SPECTROSCOPY INCLUDING AN ULTRAVID ANALYSIS CHAMBER 1 IN WHICH THE ANALYZER SAMPLE 2 WHICH IS CONNECTED TO A 3 HANDLER IS AVAILABLE OUTSIDE SUCH CHAMBER 1, AN ANALYZER 4 LOCATED NEAR THE SAMPLE AND A SOURCE OF ELECTRON 5 TRANSMITTING AN ELECTRONIC BEAM 10 IS CHARACTERIZED IN THAT IT CONTAINS BETWEEN ELECTRONIC BEAM 10 AND SAMPLE 2 WHICH 2 IS A SOLID SOLID MATERIAL, A MICROSOURCE OF PHOTONS X 6, AS CLOSER AS POSSIBLE AS SAID SAMPLE 2. /P
机译:

通过X光子电子光谱法对固体材料表面进行局部化学分析的装置,其中分析器样品2连接到3个处理器,而分析器样品2则与之相邻,而分析器样品2则在其中1个位于样品和电子5的源附近,传输电子束10的特征在于,它包含电子束10和样品2,电子束10和样品2是固体固体材料,光子X 6的微波尽可能近2.

著录项

  • 公开/公告号FR2600422A1

    专利类型

  • 公开/公告日1987-12-24

    原文格式PDF

  • 申请/专利权人 INSTRUMENTS SA;INSTRUMENTS SA;

    申请/专利号FR19860007740

  • 发明设计人 MORIN PIERRE;PIERRE MORIN;

    申请日1986-05-29

  • 分类号G01N23/227;

  • 国家 FR

  • 入库时间 2022-08-22 06:51:10

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