METHOD AND APPARATUS FOR MICROSCOPIC EVALUATION OF SUPERCONDUCTIVITY

摘要

PURPOSE:To easily measure the superconductive region in a specimen, by scanning the surface of the specimen while applying constant force to a vertical magnetically charged probe and measuring the force received by the probe or the displacement of said probe in relation to a position. CONSTITUTION:A specimen 1 is set to a horizontal specimen stand 2 and the L-shape probe 3 opposed to the specimen 1 is supported at the fulcrum 4 of a horizontal part. Magnetism is imparted to the probe 3 by an electromagnetic coil 5 so as not to break the superconductive critical magnetic field of the specimen 1. Then, the probe 3 and the specimen stand 2 are relatively moved to act upward force on the probe 3 in the superconductive region of the specimen 1 and said force is measured by the displacement measuring device 7 provided to the horizontal part of the probe 3 and the displacement measured value is displayed on a recorder 8 in relation to a measuring position. Therefore, the two-dimensional distribution of the superconductive region in the specimen can be easily measured.