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FOURIER TRANSFORMATION INFRARED SPECTRAL TYPE FILM THICKNESS METER

机译:傅里叶变换红外光谱型膜厚计

摘要

PURPOSE:To improve the measurement accuracy by converting one of two light beams which is split in the optical system of a laser interferometer from linear polarized light to circular polarized light and extracting out-of-phase interference signals from the interference light between the linear polarized light and circular polarized light. CONSTITUTION:In the luminous flux splitting optical system for laser light, a 1/8-wavelength plate 23 is provided as a means which converts the linear polarized light into the circular polarized light on the optical axis between a fixed-side plane mirror 3 and a cube half-mirrors 13. Cube samplers 24-26 as cube half-mirrors forming a means which extract the mutually out-of-phase interference signals from the interference light between the linear polarized light and circular polarized light are provided in series on the optical axis behind the cube half-mirror 13. Analyzers 27-30 are arranged on the output sides of the cube samplers 24-26 and attached laser detectors 31-34 are pro vided to the analyzers 27-30. Consequently, when one wavelength of laser light is denoted as lambda, a sample signal can be extracted optically at intervals of lambda/n (n1) and the measurement accuracy is increased up to Xn.
机译:目的:通过将在激光干涉仪的光学系统中分离的两个光束之一从线性偏振光转换为圆偏振光,并从线性偏振光之间的干涉光中提取异相干涉信号,以提高测量精度光和圆偏振光。组成:在用于激光的光束分离光学系统中,提供了一个1/8波长板23,作为将光在固定侧平面镜3和光轴之间转换为线性偏振光到圆偏振光的装置。在立方体上串联设置作为立方体半镜的立方体采样器24-26,该立方体采样器24-26形成从线性偏振光和圆偏振光之间的干涉光中提取相互异相干涉信号的装置。立方体半反射镜13后面的光轴。分析仪27-30布置在立方体采样器24-26的输出侧,并且附接的激光检测器31-34提供给分析仪27-30。因此,当将一个波长的激光表示为λ时,可以以λ/ n(n> 1)的间隔光学提取采样信号,并且测量精度提高到Xn。

著录项

  • 公开/公告号JPH01207606A

    专利类型

  • 公开/公告日1989-08-21

    原文格式PDF

  • 申请/专利权人 FUJI ELECTRIC CO LTD;

    申请/专利号JP19880033477

  • 发明设计人 IZUMI AKIO;

    申请日1988-02-16

  • 分类号G01B11/06;

  • 国家 JP

  • 入库时间 2022-08-22 06:45:43

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