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METHOD FOR EVALUATING SPHERICAL MICROLENS

机译:球形微囊的评估方法

摘要

PURPOSE:To evaluate the sphericity of a lens with high accuracy by projecting a laser beam on the spherical lens to be measured, rotating the lens around an axis intersecting orthogonally with a direction perpendicular to optical axis of light beam and observing a projection image of a multireflection interference pattern from the lens. CONSTITUTION:The spherical lens 4 to be measured is fixed on a holding table 8 by vacuum suction and a fine adjustment base 7 is so adjusted that the laser beam is projected on the center of the lens 4. The distance L between the lens 4 and a screen 2 is so adjusted that the outermost periphery of the multireflection interference pattern 5 is of size suitable for observation; and the lens 4 is rotated by a holding table rotary mechanism 9 by + or -90 deg. around the axis Z-Z intersecting orthogonally with the direction perpendicular to the optical axis X-X' of incidence of the laser beam. At this time, the worst value Rmax of the major-monitor axis ratio R of the outermost periphery of the multireflection interference pattern 5 is read. Then a permissible value R'max corresponding to requested sphericity set with accuracy of the purpose of use previously is compared with the worst value Rmax to decide whether or not the lens is normal.
机译:目的:通过在待测球面透镜上投射激光束,围绕与垂直于光束光轴的方向正交的轴旋转透镜并观察透镜的投影图像,以高精度评估透镜的球形度。镜头的多重反射干涉图样。组成:将要测量的球面透镜4通过真空抽吸固定在固定台8上,并调节微调基座7,以使激光束投射到透镜4的中心。调整屏幕2,使得多反射干涉图案5的最外周具有适于观察的尺寸。透镜4由保持台旋转机构9旋转+或-90度。围绕与垂直于激光束入射光轴X-X'的方向正交的Z-Z轴。此时,读取多反射干涉图案5的最外周的长轴比R的最差值Rmax。然后,将与先前以使用目的的精度设置的所要求的球形度相对应的允许值R'max与最差值Rmax进行比较,以判定镜片是否正常。

著录项

  • 公开/公告号JPS63284445A

    专利类型

  • 公开/公告日1988-11-21

    原文格式PDF

  • 申请/专利权人 HITACHI LTD;

    申请/专利号JP19870118805

  • 发明设计人 SATOU HITOSHI;AOKI SATOSHI;MAKI MASATOSHI;

    申请日1987-05-18

  • 分类号G01B11/30;G01B11/24;G01M11/00;

  • 国家 JP

  • 入库时间 2022-08-22 06:44:27

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