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METHOD AND APPARATUS FOR DETECTING TRACE IMPURITIES IN IMPURE INERT GAS

机译:检测不纯惰性气体中痕量杂质的方法和装置

摘要

PURPOSE: To detect the trace impurities of a reducing gas or nonreducing gas by separating the inert gas by gas chromatography, subjecting the gas to ionization discharge, and bringing the gas into contact with mercuric oxide. CONSTITUTION: An inert gas containing impurities is separated by means of a separation column 8 for chromatography by supplying the gas to the column 8 from a cylinder 4. The separated inert gas is led to an ionizing device 12 for ionization discharge. The ionization discharge is performed by passing the inert gas around an node or cathode while the electrode is maintained at a grounding voltage of 150-1,000 V. A nonreducing gas of CO2 and CH4 which are impurities are dissolved around the electrode and CO and H are isolated. Then the inert gas is made to react to mercuric acid so as to discharge mercy vapor by making the inert gas to flow through a mercuric acid bed 15. The mercury vapor is detected by means of an optical sensor 17 and the concentration of the impurity is detected. Therefore, the reducing gas and nonreducing gas can be microanalyzed.
机译:目的:通过气相色谱分离惰性气体,对气体进行电离放电,并使该气体与氧化汞接触,以检测还原性气体或非还原性气体中的微量杂质。组成:包含杂质的惰性气体通过色谱柱分离塔8进行分离,方法是从气缸4向色谱柱8输送气体。分离出的惰性气体通入电离装置12进行电离放电。通过在电极保持在150-1,000 V的接地电压的同时使惰性气体流经节点或阴极来执行电离放电。作为杂质的CO2和CH4的非还原性气体溶解在电极周围,CO和H为孤立。然后,通过使惰性气体流过汞层15,使惰性气体与汞反应,从而排放汞蒸气。借助于光学传感器17检测汞蒸气,并检测杂质的浓度。检测到。因此,可以对还原性气体和非还原性气体进行微量分析。

著录项

  • 公开/公告号JPS6465450A

    专利类型

  • 公开/公告日1989-03-10

    原文格式PDF

  • 申请/专利权人 SAES GETTERS SPA;

    申请/专利号JP19880107768

  • 发明设计人 MARUKO SUTSUCHI;

    申请日1988-05-02

  • 分类号G01N21/27;G01N27/64;G01N27/68;G01N30/74;G01N30/84;G01N31/00;

  • 国家 JP

  • 入库时间 2022-08-22 06:41:05

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