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Method and apparatus for detection of trace impurities in an impure inert gas

机译:用于检测不纯惰性气体中痕量杂质的方法和设备

摘要

A method is described for the quantitative measurement of traces of gas, particularly CO.sub.2 and CH.sub.4 which constitute impurities in impure inert gases such as rare gases and nitrogen, by means of the use of a known analyzer for reducing gases which uses a bed of mecuric oxide and makes the measurement by an optical method of the mercury vapors produced which are proportional in to the concentration of the impurities to be detected. The method of the present invention subjects the impure inert gas to an electric discharge which may be at a high voltage, capable of ionizing the impurities before the impure inert gas is made to pass through the bed of mecuric oxide. The device according to the invention comprises, between a gas-chromatographic separation column and the analyzer, an electrode within a passage through which flows the gas to be analyzed and in which there is an ionizing discharge.
机译:描述了一种通过使用已知的分析仪来定量测量痕量气体,特别是在不活泼的惰性气体(例如稀有气体和氮气)中构成杂质的痕量气体CO2和CH4的方法。气体使用氧化汞床,并通过光学方法对产生的汞蒸气进行测量,这些汞蒸气与要检测的杂质浓度成比例。本发明的方法使不纯的惰性气体经受可能处于高压的放电,该放电能够在使不纯的惰性气体通过氧化汞床之前使杂质电离。根据本发明的装置在气相色谱分离柱和分析仪之间包括在通道内的电极,待分析的气体流过该通道,并且其中存在电离放电。

著录项

  • 公开/公告号US4889814A

    专利类型

  • 公开/公告日1989-12-26

    原文格式PDF

  • 申请/专利权人 SAES GETTERS SPA;

    申请/专利号US19880184989

  • 发明设计人 MARCO SUCCI;

    申请日1988-04-22

  • 分类号G01N21/71;

  • 国家 US

  • 入库时间 2022-08-22 06:08:07

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