A METHOD OF EFFECTING NIR-ANALYSES OF SUCCESSIVE MATERIAL SAMPLES, AND A SYSTEM FOR CARRYING OUT THE METHOD

摘要

PCT No. PCT/DK89/00070 Sec. 371 Date Oct. 7, 1991 Sec. 102(e) Date Oct. 7, 1991 PCT Filed Mar. 29, 1989 PCT Pub. No. WO89/09388 PCT Pub. Date Oct. 5, 1989.With the present invention, the NIR-technique is utilized for a fully automatic on-line analyzing of successive samples, viz. with the use of a test chamber which is built together with the optical unit and is open towards this unit through a restricted side opening. The test chamber has a volume which is much larger than that of the known test cups, whereby the remnant-pollution of the following sample can be kept at an acceptable low level, without the test chamber having to be totally cleaned each time. A particularly critical area, however, is the material area just next to the optical unit, and remnants at this place must by necessity be removed. The present invention provides for a complete avoidance of such remnant deposits, in that between the side opening of the test chamber and the optical unit, there is placed a transparent, thin separation film, which between successive operations is advanced for removal of the last used film area and for delivery of a new and entirely clean film area to the critical area.