首页> 外国专利> A METHOD OF EFFECTING NIR-ANALYSES OF SUCCESSIVE MATERIAL SAMPLES, AND A SYSTEM FOR CARRYING OUT THE METHOD

A METHOD OF EFFECTING NIR-ANALYSES OF SUCCESSIVE MATERIAL SAMPLES, AND A SYSTEM FOR CARRYING OUT THE METHOD

机译:影响连续材料样品近红外分析的方法和实施该方法的系统

摘要

the analysis by the reflection in the near infrared (nir) in a sample of the material is performed on a very small sample in a test basin placed in close contact with the special unit, which is a reflection of the radiation from the surface of the sample. and, therefore, provides information on the contents of the components of interest.such as water and protein. under normal laboratory conditions, we need to clean up the toilet, carefully test and the optical unit in a series of operations for obtaining reliable results.with the present invention, the method is used for analysis of continuous fully automatic of successive samples, through the use of a test chamber (6) which is built together with the optical unit (12) and which is open in the direction of the unit. e through a side opening (26) is limited.the test chamber (6) has a volume greater than the known test cells, thereby maintaining the pollution caused by the remnants of the sample in a low acceptable, without it being necessary to complete each time to clean house for testing.a particularly critical area is formed by the material from the area just after the optical unit (12, 64) and remains at that location should be removed.the present invention provides a complete removal of the deposits of these are due to the fact that between the side opening (26) of the test chamber and the optical unit (12, 64) is disposed on a transparent thin film (20) which is separated between the successive operations.advance in order to allow the removal of the zone of the film used, and the movement of the new area of film entirely in the critical zone.
机译:通过材料样品中近红外(nir)反射的分析是在与特殊单元紧密接触的测试盆中对很小的样品进行的,这是对材料表面辐射的反射。样品。因此,提供有关目标成分(例如水和蛋白质)内容的信息。在正常实验室条件下,我们需要清理马桶,仔细测试,并通过一系列操作光学单元以获得可靠的结果。借助本发明,该方法用于连续连续样品的全自动分析,通过使用与光学单元(12)一起构建且朝着该单元方向敞开的测试室(6)。通过侧面开口(26)的限制是有限的。测试腔室(6)的体积大于已知的测试池,从而将样品残留物造成的污染保持在较低的可接受范围内,而无需完成每个步骤清洁房间进行测试的时间。特别重要的区域是由光学单元(12、64)之后的区域形成的材料形成的,应清除保留在该位置的残留物。本发明提供了这些区域的沉积物的完全清除方法这是由于以下事实:在测试腔室的侧开口(26)和光学单元(12、64)之间设置了透明薄膜(20),该薄膜在连续的操作之间是分开的。去除使用过的胶片区域,并在关键区域完全移动新的胶片区域。

著录项

  • 公开/公告号EP0414710B1

    专利类型

  • 公开/公告日1994-12-07

    原文格式PDF

  • 申请/专利权人 JESMA MATADOR AS;

    申请/专利号EP19890904529

  • 发明设计人 JOHNSEN ERIK HUUS;

    申请日1989-03-29

  • 分类号G01N21/03;G01N21/47;

  • 国家 EP

  • 入库时间 2022-08-22 04:14:20

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