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Method and device for the measurement and analysis of the physical parameters of a layered material using thermal radiometry
Method and device for the measurement and analysis of the physical parameters of a layered material using thermal radiometry
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机译:用热辐射法测量和分析层状材料的物理参数的方法和装置
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摘要
The invention relates to a method and an operative part available for analysis and measurement of physical parameters of a material (1) in layers (10,11), parameters such as absorptivity B, the diffusivity of the known layer perficial , and the thermal resistance R of the interface between the two layers by radiometry.; The sample is excited by means of a thermal energy flow, amplitude modulated at a high fre quency Fh and a low frequency Fb. The parameters are calculated from the phase and amplitude measurements of the thermal signal.; Application to non-destructive testing of industrial products.
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