BUILT-IN SELF-TEST SYSTEM FOR VLSI CIRCUIT CHIPS.

摘要

a system (10) is included in a control logic circuit (12) for wafer scale integrated (lsi) to test the operation of the dynamic logic function key (14) includes a controller (32) comprising a series of static scales (150) connected to the transfer data and to generate control signals to controlin the control system. an input register (36) connected to the shift register (32) to control the transfer of control and data set to the main logic function (14) to transfer data in parallel to control consists of a series of automatic layout static.an output register (38) connected to the input register (36) to carry out the transfer control data set and the main logic function (14) to transfer data in parallel to control consists of a series of combination static scales (182) ).a validation signal and synchronization control is blocked by a scale (78) for validation and synchronization control and triggered by a timing signal from the system to generate timing signals of input and output registers.a sampling control signal is blocked by a scale of sampling control (76), and sampled by a switching signal (80), and is used as a validation of the control register.the signal blocking signal sampling control and block validation and synchronization control are activated by the timing signal from the system and serve as a timing signal from the controller.a multiplexer (40) decodes a data output control signal generated by the selection of the control register provides control and monitoring data represented with a pin (60) for output control.