DEVICE FOR MEASURING THICKNESS AND REFRACTION INDICES OF FILMS

• 1. 薄膜夹及具有该薄膜夹的膜系材料红外复折射率测定装置 [P] . 中国专利： CN102967581B . 2015.03.25
• 2. 薄膜夹及具有该薄膜夹的膜系材料红外复折射率测定装置 [P] . 中国专利： CN102967581A . 2013-03-13
• 3. A method for measuring the thickness and refractive indices of the layer components a laminated structure and the measuring apparatus for carrying it out [P] . 德国专利： DE69714915T2 . 2003-04-24

  机译： 测量叠层结构的层成分的厚度和折射率的方法以及用于执行该方法的测量设备

• 4. Method of measuring thickness and refractive indices of component layers of laminated structure and measuring apparatus for carrying out the same [P] . 欧洲知识产权局专利： EP0814318B1 . 2002-08-28

  机译： 测量层压结构的组成层的厚度和折射率的方法及其实施装置

• 5. Method of measuring thickness and refractive indices of component layers of laminated structure and measuring apparatus for carrying out the same [P] . 欧洲知识产权局专利： EP0814318A3 . 1999-11-10

  机译： 测量层压结构的组成层的厚度和折射率的方法及其实施装置

• 1. Using Narrow Line-Width Laser to Measure the Thickness and Refractive Index of the Film [J] . Junjie Fang 自然科学期刊（英文） . 2020,第011期
• 2. MOLECULE POLARIZATION STATE FOR REFRACTIVE INDICES MATERIAL COMPENSATION FILM THICKNESS [C] . Chia-Fu Chang, Chia-Hi Chan, Zou-Ni Wan New, Improved and Existing Technologies: Non-Ferrous Materials Extraction and Processing . 2006
• 3. Optoelectronic Devices Using Tailored- and Low-Refractive Index Nanoporous Thin Films. [D] . Yan, Xing. 2013
• 4. The impact of thickness and thermal annealing on refractive index for aluminum oxide thin films deposited by atomic layer deposition [O] . Zi-Yi Wang, Rong-Jun Zhang, Hong-Liang Lu, 2015
• 5. INCREASING THE ACCURACY OF MEASURING AMPLITUDE IN CONTACTLESS CONTROL DEVICES OF THICKNESS POLYMER FILMS [O] . Юрій Володимирович Бобков, Олександр Юрійович Бобков 2016

• 1. Research and application on the automatic measuring device for testing transverse thickness difference of cold-rolling steel sheet [J] . LI XiaojieSHAN KaijunHUANG BaihuaGU BingpingYANG Guoyi and LI zhongwu Quality Inspection Center Chemical ExaminationWISCOLtd.Wuhan 430083HubeiChina . 宝钢技术研究：英文版 . 2010,第S1期
• 2. The effect ofγ-ray irradiation on the SOT magnetic films and Hall devices [J] . Tengzhi Yang ,Yan Cui ,Yanru Li . 半导体学报：英文版 . 2021,第2期
• 3. Effect of Organic Dopants in Dimetallophthalocyanine Thin Films: Application to Optoelectronic Devices [J] . María Elena Sánchez-Vergara ,Santiago Osorio-Lefler ,Pablo Osorio-Lefler . 材料物理与化学进展（英文） . 2019,第4期
• 4. The Effect of Tin on PECVD-Deposited Germanium Sulfide Thin Films for Resistive RAM Devices [J] . Rene Rodriguez ,Benjamin Poulter ,Mateo Gonzalez . 材料科学与应用期刊（英文） . 2017,第2期
• 5. 退火对Nb2O5薄膜的折射率和厚度的影响 [C] . 赵冬冬 ,郑玉祥 ,张金波 . 上海市激光学会2015年学术年会 . 2015
• 6. 光学薄膜折射率和厚度测试技术及研究 [A] . 胡容 . 2004