首页> 外国专利> method for removal of n - dotierenden impurities in the vapour deposition of silicon from a liquid or gaseous substances

method for removal of n - dotierenden impurities in the vapour deposition of silicon from a liquid or gaseous substances

机译:从液态或气态物质汽化沉积硅中去除正十二烯杂质的方法。

摘要

the vapour deposition of silicon from a liquid or gaseous substances, such as hydrogen or trichlorsilan can n dotierende impurities, characterised by adduktbildung with silicon, titanium or zinnhalogeniden removed. from the addukten can by thermal treatment and finally released the impurities to be investigated.the remaining halides are able to adduktbildung again and again to remove the impurities. the procedure can thus be operated in a cycle and is characterized by low chemikalienbedarf and environmental friendliness.
机译:硅从液态或气态物质(例如氢或三氯硅烷)中汽相沉积,会产生杂质,其特征在于可去除硅,钛或锌卤代亚胺。通过热处理可以从加成罐中除去杂质,最后释放出待研究的杂质。剩余的卤化物能够一次又一次地加成去除杂质。因此,该过程可以循环进行,并且具有化学成分低和环境友好的特点。

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号