METHOD AND SYSTEM FOR FUNCTIONALLY MONITORING OR TESTING AT HIGH SPEED AND WITH HIGH PRECISION OF MEMORIES IN MICROPROCESSOR UNITS

摘要

P The invention relates to a method and a system for controlling or testing functionally at high speed and with great precision memories stored in microprocessor units or devices subjected to the test, the test system being effectively permanently connected to the bus structure of the unit under test during the execution of a test and operating at the clock speed of the unit under test; the test program can be stored in the memory of the unit under test or it can be electrically transferred from the memory of the test system to the memory under test using a memory recovery technique; the test speed of a memory can be further increased by advantageously exploiting the special features of moving and comparing blocks of recent microprocessors; an algorithm is provided which exploits these particularities of displacement and comparison of blocks. /P