Sampling wave-form digitizer for dynamic testing of high speed data conversion components

摘要

A sampling digitizer system which may be expanded for the dynamic testing of high speed data conversion components is provided. The sampling waveform digitizer system comprises a sampling comparator for comparing a sampled input signal with a first signal. An integrator coupled to the comparator provides an output signal from the integrator and becomes the first signal. An analog to digital converter provides the digital representation of the analog waveform. A controllable delay is provided for selecting a period of time for sampling the input signal by the comparator. A control device is provided for controlling the time the comparator samples the input signal. These combination of system features allow the digitizer to receive high speed analog waveforms and convert them to an accurate digital representation of the previously described high speed analog waveform.