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Method of etching silicon by enhancing silicon etching capability of alkali hydroxide through the addition of positive valence impurity ions

机译:通过添加正价杂质离子增强碱金属氢氧化物的硅蚀刻能力来蚀刻硅的方法

摘要

The ability of alkali hydroxide to etch silicon is enhanced by the controlled addition of metallic salts which readily dissociate in a strong base (pH≧10) solution. When introduced into the alkali hydroxide (e.g. potassium hydroxide) solution, the controlled concentrations of additive metallic ions increase the electronegativity of the solution and thereby enhance its ability to attract electrons away from the silicon atoms within the crystal lattice being etched. By adding controlled levels of properly chosen electropositive ions, the rate at which the electrons are removed from the silicon atoms in the surface planes of the crystal lattice that are exposed to the etching solution can be controllably increased. As a result of removal of the electrons from the silicon atoms, the silicon atoms dissolve out of the crystal planes at rates modified by the degree of impurity addition, resulting in improved etching characteristics and geometries over that of conventionally employed alkali hydroxide solution.
机译:通过控制添加容易在强碱(pH≧ 10)溶液中解离的金属盐,可以增强碱金属氢氧化物蚀刻硅的能力。当将其引入碱金属氢氧化物(例如氢氧化钾)溶液中时,受控浓度的添加金属离子增加了溶液的电负性,从而增强了其将电子从被蚀刻的晶格内的硅原子吸引开的能力。通过加入适当选择的正电离子的控制水平,的速率将电子从在暴露于蚀刻溶液可以可控增加晶格的表面平面中的硅原子去除。从硅原子上除去电子的结果是,硅原子以杂质添加程度改变的速率从晶面中溶出,与常规使用的碱金属氢氧化物溶液相比,蚀刻性能和几何形状得到改善。

著录项

  • 公开/公告号US4859280A

    专利类型

  • 公开/公告日1989-08-22

    原文格式PDF

  • 申请/专利权人 HARRIS CORPORATION;

    申请/专利号US19880187268

  • 发明设计人 EDWARD U. ADAMS;ROBERT K. LOWRY;

    申请日1988-04-28

  • 分类号B44C1/22;C09K13/02;

  • 国家 US

  • 入库时间 2022-08-22 06:27:34

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