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LOGIC UNIT TEST DEVICE FOR SPECIAL ENVIRONMENT DEVICE

机译:特殊环境设备的逻辑单元测试设备

摘要

PURPOSE:To economically realize a test device for a logic unit of a special environment device by replacing electrically the logic unit with a general-purpose logic unit of a test device having the characteristic equivalent to those of the logic unit. CONSTITUTION:The general-purpose logic units (5-1) - (5-n) form a circuit equivalent to the logic unit 2 of a special environment device on an ordinary general- purpose base board. When the unit 3 is tested, one of units (5-1) - (5-n) is pulled out of a connector and the unit 3 of the special environment device to be tested is connected to the corresponding one of conversion parts (4-1) - (4-n). Then the unit 3 is tested by an external test device 2. Thus it is not required to produce a complicated test device exclusive for the unit 3 of the special environment device having an extremely small number of products. As a result, the test device is economically obtained for the unit 3 of the special environment device.
机译:用途:为了经济地实现用于特殊环境设备的逻辑单元的测试设备,方法是用具有等同于逻辑单元特性的测试设备的通用逻辑单元来代替该逻辑单元。组成:通用逻辑单元(5-1)-(5-n)构成等效于普通通用基板上特殊环境设备逻辑单元2的电路。在测试单元3时,将单元(5-1)-(5-n)中的一个从连接器中拔出,并将要测试的特殊环境设备的单元3连接到相应的转换部件之一(4 -1)-(4-n)。然后,通过外部测试装置2对单元3进行测试。因此,不需要生产专用于环境极少数产品的特殊环境装置的单元3的复杂测试装置。结果,经济地获得了用于特殊环境设备的单元3的测试设备。

著录项

  • 公开/公告号JPH02146636A

    专利类型

  • 公开/公告日1990-06-05

    原文格式PDF

  • 申请/专利权人 FUJITSU LTD;

    申请/专利号JP19880299581

  • 发明设计人 OSHITA KATSUNORI;SAEKI KENSUKE;

    申请日1988-11-29

  • 分类号G06F11/22;

  • 国家 JP

  • 入库时间 2022-08-22 06:24:13

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