首页> 外国专利> METHOD AND DEVICE FOR MEASURING COERCIVE FORCE OF MAGNETIC THIN FILM FORMED BY SLANTING INCIDENCE VAPOR-DEPOSITING METHOD

METHOD AND DEVICE FOR MEASURING COERCIVE FORCE OF MAGNETIC THIN FILM FORMED BY SLANTING INCIDENCE VAPOR-DEPOSITING METHOD

机译:倾斜入射蒸镀法形成的磁性薄膜矫顽力的测量方法和装置

摘要

PURPOSE:To measure the coercive force of a magnetic thin film nondestructively during its manufacture by irradiating the surface of the magnetic thin film which is formed by a slanting incidence vapor-depositing means with two homogeneous light beams in different directions, and measuring the maximum transmissivity and its transmissivity. CONSTITUTION:The magnetic thin film 2 formed on a transparent glass substrate 1 by the slanting incidence vapor-depositing method is irradiated with homogeneous light beams by light sources 3 and 4 in two different directions, i.e. direction where the light transmittissity in a vapor flow surface when the magnetic thin film is vapor-deposited is maximum and direction which is at a specific direction tens of degrees away from said direction, and respective transmitted light beams are converted by photoelectric converters 5 and 6 into electric signals to measure the maximum transmissivity Tmax and transmissivity Tphi of the homogeneous light in each direction. Arithmetic based upon an equation is carried out by using the measured values to obtain the coercive force Hc of the magnetic thin film by reading a measuring instrument 12.
机译:目的:通过倾斜入射蒸汽沉积装置形成的磁性薄膜表面在不同方向上用两个均匀光束照射磁性薄膜的表面,以无损地测量磁性薄膜的矫顽力,并测量最大透射率及其透射率。组成:通过倾斜入射气相沉积法在透明玻璃基板1上形成的磁性薄膜2受到光源3和4沿两个不同方向(即,蒸气在流动表面中的光透射率的方向)的均匀光束照射当磁性薄膜被汽相沉积时,最大方向是与所述方向成几十度的特定方向,并且相应的透射光束被光电转换器5和6转换成电信号以测量最大透射率Tmax和均匀光在每个方向上的透射率Tphi。通过使用测量值来执行基于方程的算术,以通过读取测量仪器12来获得磁性薄膜的矫顽力Hc。

著录项

  • 公开/公告号JPH02675B2

    专利类型

  • 公开/公告日1990-01-09

    原文格式PDF

  • 申请/专利权人 TAIYO YUDEN KK;

    申请/专利号JP19830140560

  • 发明设计人 ARIKAWA SETSU;TATSUNO TETSUO;

    申请日1983-08-02

  • 分类号G01R33/12;H01F41/20;

  • 国家 JP

  • 入库时间 2022-08-22 06:20:15

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