Method for the investigation of ultrafast processes

摘要

Method for the examination of ultra-fast processes with high spatial and temporal resolution in microscopic samples. Use is made of two laser beams, an excitation beam and a test beam, which differ from each other in at least one of the parameters of wavelength, modulation, polarisation direction and/or direction of incidence. Both beams are spatially independent of each other and can be applied to the sample in any arbitrary temporal sequence.