首页> 外国专利> FLOWING GAS SEAL ENCLOSURE FOR PROCESSING WORKPIECE SURFACE WITH CONTROLLED GASENVIRONMENT AND INTENSE LASER IRRADIATION

FLOWING GAS SEAL ENCLOSURE FOR PROCESSING WORKPIECE SURFACE WITH CONTROLLED GASENVIRONMENT AND INTENSE LASER IRRADIATION

机译:用受控的环境和强激光辐照加工工件表面的气体密封件

摘要

Abstract of the DisclosureA controlled gas environment is provided against asurface area of a semiconductor wafer for performing processeson the area in the fabrication of integrated circuits thereon,including processes of deposition, impurity implantation,etching, ablation, and other radiation induced chemicalprocesses involving the gas atmosphere by maintaining acontinuous gas flow over the area and a portion of thesurrounding area of the wafer surface covered by an enclosurethat is suspended on the surface on a film of the flowing gas,the pressure, temperature and composition of the gasatmosphere against the surface area being controlled to meetthe requirements of each processing step and/or to carry awayparticles while the gas seal is maintained. In a particularembodiment, intense ultraviolet (UV) laser radiation isfocused by an optical system on a target on the semiconductorwafer surface through the suspended enclosure while the waferis held on a table that moves in the plane of the wafersurface in order to expose different selected areas of thesurface to the combined effects of the UV radiation and thegas atmosphere.
机译:披露摘要提供了可控的气体环境用于执行工艺的半导体晶圆的表面积在其上集成电路制造领域上,包括沉积,杂质注入,蚀刻,烧蚀和其他辐射诱发的化学物质维持气体气氛的过程区域和部分区域的连续气流外壳覆盖的晶圆表面的周围区域悬浮在流动气体膜的表面上,气体的压力,温度和成分大气对表面积的控制要满足每个处理步骤的要求和/或带走保持气密性的过程中产生颗粒。在特定的实施例中,强紫外线(UV)激光辐射是由光学系统聚焦在半导体上的目标上晶圆表面通过悬置外壳,而晶圆被保持在晶片平面上移动的桌子上以暴露表面的不同选定区域表面受紫外线辐射和气体气氛。

著录项

  • 公开/公告号CA1275741C

    专利类型

  • 公开/公告日1990-10-30

    原文格式PDF

  • 申请/专利权人 IMAGE MICRO SYSTEMS INC.;

    申请/专利号CA19870555631

  • 发明设计人 PIWCZYK BERNHARD;

    申请日1987-12-30

  • 分类号H01L21/50;

  • 国家 CA

  • 入库时间 2022-08-22 06:16:05

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