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METHOD OF DETERMINING MAGNETIZATION OF SUBLATTICES OF EPITAXIAL DOMAIN-CONTAINING FERROMAGNETIC FILM
METHOD OF DETERMINING MAGNETIZATION OF SUBLATTICES OF EPITAXIAL DOMAIN-CONTAINING FERROMAGNETIC FILM
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机译:测定表位域铁磁薄膜的子磁化强度的方法
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the invention u043eu0442u043du043eu0441u0438u0442u0441u00a0 to computer technology and can be used in the selection of media u0434u043bu00a0 clocking u043cu0430u0433u043du0438u0442u043eu043eu043fu0442u0438u0447u0435u0441u043au0438u0445 u0443u043fu0440u0430u0432u043bu00a0u0435u043cu044bu0445 t u0440u0430u043du0441u043fu043eu0440u0442u0435u0440u043eu0432. purpose u0438u0437u043eu0431u0440u0435u0442u0435u043du0438u00a0 u00a0u0432u043bu00a0u0435u0442u0441u00a0 simplification method.u0434u043bu00a0 u043eu043fu0440u0435u0434u0435u043bu0435u043du0438u00a0 u043du0430u043cu0430u0433u043du0438u0447u0435u043du043du043eu0441u0442u0438 u043fu043eu0434u0440u0435u0448u0435u0442u043eu043a u044du043fu0438u0442u0430u043au0441u0438u0430u043bu044cu043du043eu0439 u0434u043eu043cu0435u043du043eu0441u043eu0434u0435u0440u0436u0430u0449u0435u0439 u0444u0435u0440u0440u043eu043cu0430u0433u043du0438u0442u043du043eu0439 film u0438u0437u043cu0435u0440u00a0u044eu0442 width u043fu043eu043bu043eu0441u043eu0432u044bu0445 domains in the absence of magnetic on u043bu00a0 in the center and near the edges of the film and the measured u0437u043du0430u0447u0435u043du0438u00a0u043c u0441u0443u0434u00a0u0442 on u043du0430u043cu0430u0433u043du0438u0447u0435u043du043du043eu0441u0442u0438 u043fu043eu0434u0440u0435u0448u0435u0442u043eu043a film. the measurement of the width of the u043fu043eu043bu043eu0441u043eu0432u044bu0445 domains u043eu0441u0443u0449u0435u0441u0442u0432u043bu00a0u044eu0442 on u0440u0430u0441u0441u0442u043eu00a0u043du0438u0438 20 to 500 microns from the edges of the film. 1, z. s - lu.
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