METHOD OF SIMULATION OF CHANGES OF PARAMETERS OF ELECTRIC CONDUCTING SURFACE FOR TESTING INSTRUMENTS HAVING EDDY TRANSDUCERS

摘要

the invention u043eu0442u043du043eu0441u0438u0442u0441u00a0 to measuring technology, in particular to the means of u0438u0441u043fu044bu0442u0430u043du0438u00a0 devices with u0432u0438u0445u0440u0435u0442u043eu043au043eu0432u044bu043cu0438 u043fu0440u0435u043eu0431u0440u0430u0437u043eu0432u0430u0442u0435u043bu00a0u043cu0438. the purpose of u0438u0437u043eu0431u0440u0435u0442u0435u043du0438u00a0 - extension of the u043fu0440u0438u043cu0435u043du0435u043du0438u00a0 and improving the accuracy of the simulation.method based on focused functional changes in electrical parameters applied to the measuring coil u0432u0438u0445u0440u0435u0442u043eu043au043eu0432u043eu0433u043e u043fu0440u0435u043eu0431u0440u0430u0437u043eu0432u0430u0442u0435u043bu00a0 by ra u0441u043fu043eu043bu043eu0436u0435u043du0438u00a0 at fixed u0440u0430u0441u0441u0442u043eu00a0u043du0438u0438 on simulation stationary coil inductance, resistance chain which shut in pressure, u0444u0443u043du043au0446u0438 u043eu043du0430u043bu044cu043du043e u0438u0437u043cu0435u043du00a0u0435u043cu043eu0439 signals from external sources, and thus an effectsimilar effects u0442u043eu043au043eu043fu0440u043eu0432u043eu0434u00a0u0449u0435u0439 surface during its movement relative to the measuring coil u0432u0438u0445u0440u0435u0442u043eu043au043eu0432u043eu0433u043e u043fu0440u0435u043eu0431u0440u0430u0437u043eu0432u0430u0442u0435u043bu00a0. 4).