首页> 外国专利> Method of non-destructive testing and detection of defects in electrically conducting material using eddy current test method overcomes/reduces some limitations and error sources

Method of non-destructive testing and detection of defects in electrically conducting material using eddy current test method overcomes/reduces some limitations and error sources

机译:使用涡流测试方法进行无损检测和导电材料缺陷检测的方法克服/减少了一些限制和误差源

摘要

The method involves using the eddy current method with a measurement head of the magnetometer or gradiometer type and comparison of measurements on defects with measurements on a reference body. Defects are classified into groove-like and non-groove-like defects using measurement results measured as complex induction voltages. A normalised measurement parameter for normalising the induction voltage is selected depending on the crack class and selected measurement head. A groove calibration curve is formed for various groove depths in the reference body(ies). The measured voltage (VR) is normalised and compared with the calibration curve to determine the groove depth.
机译:该方法涉及将涡流方法与磁力计或梯度计类型的测量头一起使用,并将缺陷的测量结果与参考体的测量结果进行比较。使用作为复杂感应电压测量的测量结果,将缺陷分为凹槽状和非凹槽状缺陷。根据裂纹类别和选择的测量头来选择用于归一化感应电压的归一化测量参数。针对基准体中的各种凹槽深度形成凹槽校准曲线。归一化所测电压(VR),并将其与校准曲线进行比较以确定凹槽深度。

著录项

  • 公开/公告号DE19945944A1

    专利类型

  • 公开/公告日2001-05-31

    原文格式PDF

  • 申请/专利权人 SIEMENS AG;

    申请/专利号DE1999145944

  • 发明设计人 DAALMANS GABRIEL;LUDWIG KLAUS;

    申请日1999-09-24

  • 分类号G01N27/90;

  • 国家 DE

  • 入库时间 2022-08-22 01:10:18

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