Test data compression in function tester - applying digital signal train to tested sample and receiving reply signals for testing

摘要

A train of digital signals is applied to a sample and the reply signals are used for the function test. The digital signals are generated from stored function testing signals. The function test data are stored for further function testing. The stored function testing data are then read-out from the memory. The selected parts of the function testing data are transmitted for generating the digital signal train w.r.t. a preset time unit. The part of the function testing data with a high changing incidence for each preset time unit are stored, and those with a low change incidence at each point of time with a data change are also stored. USE/ADVANTAGE - For testing integrated or printed circuit board, with reduced data transmit time from control testing units.