首页> 外国专利> FORMATION OF TEMPERATURE PATTERN OF HEATER AND CONTROLLING DEVICE FOR GROWTH OF SI SINGLE CRYSTAL WITH ITS TEMPERATURE PATTERN UTILIZED THEREFOR

FORMATION OF TEMPERATURE PATTERN OF HEATER AND CONTROLLING DEVICE FOR GROWTH OF SI SINGLE CRYSTAL WITH ITS TEMPERATURE PATTERN UTILIZED THEREFOR

机译:利用SI晶体温度形成的加热器温度模式及其控制装置。

摘要

PURPOSE:To easily control the shape and quality of single crystal by setting a specified temp. pattern relating to the target temp. of a heater and adopting a constitution wherein fluctuation caused therefrom is made small in growth of Si single crystal by a CZ process. CONSTITUTION:A constitution described hereunder is added to a controlling device for growth of Si single crystal which is equipped with a device 40 that photographs the vicinity 361 of the growth part of Si single crystal 36 and outputs a picture signal, a device 54 that processes this picture signal and measures the diameter Di of the growth part of Si single crystal, a means 52 for the purpose of setting the target pattern Do(X) of the diameter as a function of the pulling-up distance X of Si single crystal, a motor 28 for pulling up Si single crystal, the means 55, 56, 58 for controlling the rotational speed of the motor 28 so that the control deviation (Di - Do) of the diameter approaches zero, a means 48 for detecting the temp. correspondent to the temp. of a heater 24 for heating and melting Si in a crucible 22 and the means 65, 66 for controlling electric power supplied to the heater 24 so that the detected temp. is regulated to the target temp. T0. In other words, a means 60 for setting the temp. pattern TB(X) as the function of the pulling-up distance X and a means 63 which supplys total of both value K (Di - Do) proportional to the control deviation of the diameter and the output value TB of the temp. pattern setting means 60 to the electric power controlling means 65, 66 as the target temp. T0 are added.
机译:目的:通过设置指定温度轻松控制单晶的形状和质量。与目标温度有关的模式加热器的结构,采用通过CZ法使Si单晶的生长变小的结构。构成:以下描述的构成被添加到用于硅单晶生长的控制设备中,该设备配备有拍摄硅单晶36的生长部分附近361并输出图像信号的设备40,处理设备该图像信号并测量Si单晶的生长部分的直径Di,该装置52用于根据Si单晶的上拉距离X来设置直径的目标图案Do(X),电动机28用于提拉Si单晶,装置55、56、58用于控制电动机28的转速,以使直径的控制偏差(Di-Do)接近零,装置48用于检测温度。对应于温度用于在坩埚22中加热和熔化Si的加热器24的结构和用于控制提供给加热器24的电功率的装置65、66,以便检测到的温度。被调节到目标温度。 T0。换句话说,用于设置温度的装置60。模式TB(X)作为上拉距离X的函数,并且装置63提供与直径的控制偏差和温度的输出值TB成比例的值K(Di-Do)的总和。模式设定装置60至电力控制装置65、66作为目标温度。添加T0。

著录项

  • 公开/公告号JPH03137092A

    专利类型

  • 公开/公告日1991-06-11

    原文格式PDF

  • 申请/专利权人 SHIN ETSU HANDOTAI CO LTD;

    申请/专利号JP19890273517

  • 发明设计人 ARAKI KENJI;MAEDA AKIO;BABA MASAHIKO;

    申请日1989-10-20

  • 分类号C30B15/00;C30B15/14;C30B15/26;C30B29/06;H01L21/208;

  • 国家 JP

  • 入库时间 2022-08-22 06:06:44

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