首页> 外国专利> METHOD AND APPARATUS FOR JUDGING ACCEPTANCE OF MEASURED SAMPLE

METHOD AND APPARATUS FOR JUDGING ACCEPTANCE OF MEASURED SAMPLE

机译:判断被测样品是否合格的方法和装置

摘要

PURPOSE:To judge acceptance of a measured sample accurately and quickly by a single measuring operation by comparing a measured value at each step corresponding to set conditions with a reference value sequentially in a series of characteristic data obtained from results of measurement. CONSTITUTION:Information for start of comparison is inputted from a switch section 53 and when need is determined, a control section 52 picks up measuring conditions of a step 1 to be set for a signal oscillating section 12, an AMP section 13 and a measuring circuit section 14 which upper and lower limit values are set for a comparison section 32 corresponding to the step 1. Then, a switch SW2 is closed at a scanning section 21 and a measurement by comparison is performed according to the set conditions. Thereafter, the same processing is performed sequentially from a step 2 to a step 3. After the end of a series of processings for all steps, results of judgement are taken out for all steps already loaded into a memory to judge acceptance thereof through a judging section 35.
机译:目的:通过从测量结果获得的一系列特征数据中,依次比较与设定条件相对应的每个步骤的测量值与参考值,通过一次测量操作即可准确,快速地判断是否接受了被测样品。构成:从开关部分53输入用于开始比较的信息,并且在确定需要时,控制部分52拾取要为信号振荡部分12,AMP部分13和测量电路设置的步骤1的测量条件。在步骤14中,为与步骤1相对应的比较部分32设置上限值和下限值。然后,在扫描部分21处闭合开关SW2,并根据所设置的条件进行比较测量。此后,从步骤2到步骤3依次执行相同的处理。在所有步骤的一系列处理结束之后,针对已经加载到存储器中的所有步骤取出判断结果,以通过判断来判断其是否可接受。第35条。

著录项

  • 公开/公告号JPH03137574A

    专利类型

  • 公开/公告日1991-06-12

    原文格式PDF

  • 申请/专利权人 HIOKI EE CORP;

    申请/专利号JP19890275670

  • 发明设计人 HORIUCHI WATARU;

    申请日1989-10-23

  • 分类号G01R27/02;G01R19/165;

  • 国家 JP

  • 入库时间 2022-08-22 06:06:42

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