首页> 外国专利> CALIBRATION METHOD FOR AREA RATIO METER FOR PLATE PATTERN

CALIBRATION METHOD FOR AREA RATIO METER FOR PLATE PATTERN

机译:平板图形面积比标定方法

摘要

PURPOSE:To improve the measuring accuracy of the pattern area ratio meter, by correcting the measured result of the pattern area ratio based on the distribution data of irregularity in optical reflectivity which is obtained by utilizing a non- image area in the vertical and lateraldirections of the plate. CONSTITUTION:The printing plate 20 is conveyed to the part under a photoelectric sensor 10, and linear detecting scanning is performed at this part. Gripper ends 21 and a calibration mark 23 are provided on the printing plate 20, or a solid part in the printing image part is set as the calibration mark. The non- image part 24 and the printing image part 25 are discriminated by the calibration mark 23. The photoelectric detector 13 is composed of a photodiode which performs the photoelectric transducing of the reflected light from the printing plate 20; an operation amplifier, which receives the output of the photodiode as one input; and a resistor and a capacitor which are connected across the input and output of the operation amplifier.
机译:目的:通过基于光反射率不规则性的分布数据校正图案面积比的测量结果,从而提高图案面积比测量仪的测量精度,该分布数据是利用光的垂直和横向非图像区域获得的碟子。组成:将印版20传送到光电传感器10下方的零件,并在该零件上执行线性检测扫描。在印刷版20上设置抓取器端部21和校准标记23,或者将印刷图像部分中的实心部分设置为校准标记。非图像部分24和印刷图像部分25由校准标记23区分。光电检测器13由光电二极管构成,该光电二极管对来自印刷版20的反射光进行光电转换。运算放大器,其接收光电二极管的输出作为一个输入;电阻器和电容器跨接在运算放大器的输入和输出之间。

著录项

  • 公开/公告号JPH0342403B2

    专利类型

  • 公开/公告日1991-06-27

    原文格式PDF

  • 申请/专利权人

    申请/专利号JP19820053213

  • 发明设计人

    申请日1982-03-31

  • 分类号B41F31/02;G01B11/28;

  • 国家 JP

  • 入库时间 2022-08-22 06:02:45

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