首页> 外国专利> PROCESS OF POLYCRYSTALLINE SILICON THIN FILM

PROCESS OF POLYCRYSTALLINE SILICON THIN FILM

机译:多晶硅硅薄膜的制备工艺

摘要

PURPOSE:To obtain a uniform polysilicon thin film by arranging a heat reflecting member so as to cover a silicon wafer arranged on a heater arranged in a vacuum vessel. CONSTITUTION:A heater 3 is arranged in a vacuum vessel 4; a silicon wafer 2 is arranged on the heater, a cage type heat reflecting plate 5 is arranged above the wafer so as to cover it; the plate 5 is equipped with gas flowing holes 5a. After the heater 3 is heated at about 600-800 deg.C while the vacuum vessel 4 is vacuumized with a diffusion pump, SiH4 gas and N2 gas are introduced, thereby producing polysilicon. By this method, the reaction efficiency of silicon material gas is increased, and a thin film can be produced by using the less amount of gas. By the effect of a heat reflecting member, processing is enabled at a temperature lower than a cold wall type; the high temperature part where gas decomposition reaction is generated is limited only in the upper part of a wafer, and therefore powder is not generated. Hence a silicon thin film excellent in uniformity can be obtained.
机译:目的:通过布置热反射构件以覆盖布置在真空容器中的加热器上的硅片,获得均匀的多晶硅薄膜。组成:加热器3装在真空容器4中;在加热器上配置有硅晶片2,在晶片上方配置有笼型的热反射板5以覆盖该晶片。板5上设有气体流通孔5a。在用扩散泵将真空容器4抽真空的同时将加热器3加热到约600-800℃之后,引入SiH 4气体和N 2气体,从而产生多晶硅。通过这种方法,提高了硅材料气体的反应效率,并且可以通过使用较少量的气体来制造薄膜。通过热反射构件的作用,能够在低于冷壁型的温度下进行处理;产生气体分解反应的高温部分仅在晶片的上部受到限制,因此不会产生粉末。因此,可以获得均匀性优异的硅薄膜。

著录项

  • 公开/公告号JPH0397221A

    专利类型

  • 公开/公告日1991-04-23

    原文格式PDF

  • 申请/专利权人 MEIDENSHA CORP;

    申请/专利号JP19890235314

  • 发明设计人 MORIKAWA YOSHIKI;

    申请日1989-09-11

  • 分类号H01L21/205;

  • 国家 JP

  • 入库时间 2022-08-22 06:00:23

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