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Calibration method for apparatus evaluating microwave/millimeter wave circuits

机译:用于评估微波/毫米波电路的设备的校准方法

摘要

A calibration procedure for vector network analyzers utilizing a known standard, an unknown standard and a pair of offsets bearing a known length ratio (2:1) between them whereby measurements taken on the standards and their combinations with the offsets result in self- verifying redundant equations which furnish: (1) error terms according to well-known flow graph models, (2) the reflection of the unknown standard, (3) the transmission factor of the waveguiding medium from which the offsets are realized regardless of the waveguide's loss or dispersion, and (4) a figure of merit (corruption coefficient) for the quality of the acquired raw data without the necessity for computing the error terms, connecting verification standards or otherwise completing the calibration process.
机译:矢量网络分析仪的校准程序,利用已知的标准,未知的标准和一对偏移量之间的已知长度比(2:1),从而对标准品进行的测量及其与偏移量的组合导致自我验证冗余提供以下方程式:(1)根据众所周知的流程图模型的误差项;(2)未知标准的反射;(3)波导介质的传输因数,无论波导的损耗或损耗如何,都可以从中实现偏移(4)获得的原始数据质量的品质因数(腐败系数),而无需计算误差项,连接验证标准或完成校准过程。

著录项

  • 公开/公告号JPH03500929A

    专利类型

  • 公开/公告日1991-02-28

    原文格式PDF

  • 申请/专利权人

    申请/专利号JP19880500510

  • 发明设计人

    申请日1988-10-25

  • 分类号G01R27/28;G01R35/00;

  • 国家 JP

  • 入库时间 2022-08-22 06:00:19

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