METHOD AND DEVICE FOR MEASURING SPACE OF SURFACE OF ELECTRON DIFFRACTION IMAGE IN TRANSMISSION ELECTRON MICROSCOPE

摘要

The invention relates to a method and device that make it possible to determine interplanar distances in electron diffraction images in electron microscopes. This is done through its beam stopper, which originally was used only to interrupt the central beam for better display of the diffraction image. The invention makes possible the elimination of errors normally committed in determining said distances, many of them related to the deformation of the film and to unsuitably exposed photographs.